Silicon FIB TEM Specimen Grids


  •  Standard 3mm geometry with 100µm thickness fits in any TEM and FIB preparation sample holder
  • B-doped conductive silicon minimizes charging during sample preparation and TEM imaging
  • Posts are 200µm tall and 80µm in width with a 60µm long flat on top to accommodate different size lamella and minimize the need for FIB etching
Front view of FIB-TEM Grid Holder
Closer view of four fingers of FIB-TEM grid holder
Closer view of four fingers of FIB TEM grid holder